ANALYSIS DEVICE, SPECIMEN SAMPLING IMPLEMENT AND ANALYSIS PROCESS

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United States of America Patent

APP PUB NO 20150044773A1
SERIAL NO

14453376

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An analysis device 1 includes an analysis sample preparation section, a specimen sampling implement conveyance member, an analysis section, and a control section. The analysis sample preparation section uses a specimen and an analysis sample preparation member to prepare an analysis sample of the specimen. A specimen sampling implement, which retains the specimen, is mounted to the specimen sampling implement conveyance member from externally thereto, and the specimen sampling implement conveyance member conveys the specimen sampling implement. The analysis section analyzes the analysis sample. The control section controls the specimen sampling implement conveyance member so as to convey the specimen sampling implement to the analysis sample preparation section and directly transfer the specimen from the specimen sampling implement to the analysis sample preparation member at the analysis sample preparation member.

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Patent Owner(s)

Patent OwnerAddress
ARKRAY INC57 NISHIAKETA-CHO HIGASHIKUJO MINAMI-KU KYOTO-SHI KYOTO 601-8045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kasai, Tokuo Kyoto-shi, JP 21 533

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