FREQUENCY MODULATION CONTINUOUS WAVE RADAR LEVEL METER AND MEASURING METHOD FOR THE SAME
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United States of America Patent
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Issued Date -
Feb 5, 2015
app pub date -
Jul 30, 2013
filing date -
Jul 30, 2013
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A measuring method for a frequency modulation continuous wave radar level meter is performed after presetting a previous-cycle weight and a current-cycle weight and acquiring a measured result in a previous cycle, and has steps of constantly transmitting a frequency modulation (FM) signal and receiving multiple reflected signals, obtaining a frequency difference between the FM signal and each reflected signal, selecting a characteristic frequency from a frequency spectrum, and calculating a measured result in the current cycle taken as the measured result in the previous cycle for calculating a measured result in a next cycle with a sum of a product of the measured result in the previous cycle and the previous-cycle weight and a product of a distance corresponding to the characteristic frequency so as to reduce variations of the measured result in each cycle and facilitate statistical analysis.
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
FINETEK CO LTD | NO 16 ZIQIANG ST TUCHENG DIST NEW TAIPEI CITY 236 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
CHEN, Jia-Hung | New Taipei, TW | 26 | 597 |
# of filed Patents : 26 Total Citations : 597 | |||
CHENG, Chao-Kai | New Taipei, TW | 60 | 522 |
# of filed Patents : 60 Total Citations : 522 | |||
CHENG, Shu-Chien | New Taipei, TW | 4 | 233 |
# of filed Patents : 4 Total Citations : 233 | |||
LIU, Yi-Wei | New Taipei, TW | 28 | 201 |
# of filed Patents : 28 Total Citations : 201 |
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Patent Citation Ranking
- 4 Citation Count
- G01F Class
- 12.88 % this patent is cited more than
- 10 Age
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