STRESS ASSESSMENT DEVICE, STRESS ASSESSMENT METHOD AND RECORDING MEDIUM

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United States of America Patent

SERIAL NO

14383525

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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It is an object of this invention to provide a stress assessment device capable of assessing mental stress without requiring another previous knowledge or imposing a load on an observer or an employee. A stress assessment device (10) of this invention includes: a work behavior acquisition unit (101) for acquiring a work behavior time-series pattern serving as information indicating a work behavior of each employee in temporal units; an eigen-behavior time-series pattern calculation unit (102) for calculating an eigen-behavior time-series pattern serving as information indicating a standard work behavior of each employee by using the work behavior time-series pattern; and a stress state assessment unit (103) for calculating a reconstruction accuracy indicating a degree to which the work behavior time-series pattern of each employee and the eigen-behavior time-series pattern agree with each other and assessing a stress state of the employee based on the calculated reconstruction accuracy.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATION108-8001 TOKYO
TOKYO INSTITUTE OF TECHNOLOGY2-12-1 OOKAYAMA MEGURO-KU TOKYO 152-8550

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kamiya, Yuki Tokyo, JP 21 35
Kunieda, Kazuo Tokyo, JP 6 128
Nitta, Katsumi Tokyo, JP 4 14
Okada, Shogo Tokyo, JP 7 23
Sato, Yusaku Tokyo, JP 2 5

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