Clock generation circuit that tracks critical path across process, voltage and temperature variation
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United States of America Patent
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Mar 21, 2017
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Jul 3, 2014
filing date -
Jul 3, 2013
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Abstract
Clock generation circuit that track critical path across process, voltage and temperature variation. In accordance with a first embodiment of the present invention, an integrated circuit device includes an oscillator electronic circuit on the integrated circuit device configured to produce an oscillating signal and a receiving electronic circuit configured to use the oscillating signal as a system clock. The oscillating signal tracks a frequency-voltage characteristic of the receiving electronic circuit across process, voltage and temperature variations. The oscillating signal may be independent of any off-chip oscillating reference signal.
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