METHOD FOR QUANTIFYING SKIN CHANGES CAUSED BY SIX EXTERNAL EVILS AND METHOD FOR SCREENING SKIN CONDITION-IMPROVING MATERIALS USING THE SAME

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United States of America Patent

SERIAL NO

14478733

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A method for quantifying skin changes caused by six external evils and a method of screening skin condition-improving materials using the quantification method are described. More specifically, disclosed are a method of measuring cellular changes caused by external stimuli in a skin cell culture system, in which the degree of cellular changes obtained by applying suitable stimuli of six external evils to skin cells being cultured is measured by cellular biochemical methods, such that the conceptual effects of six external evils suggested in the prior art can be scientifically and quantitatively expressed, and a method of screening skin condition-improving materials using the measurement method.

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Patent OwnerAddress
AMOREPACIFIC CORPSEOUL CITY KOREA SEOUL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIM, Duck Hee Seoul, KR 54 171
KIM, Han Kon Suwon, KR 42 285
KWON, Sun Sang Yongin, KR 7 16
LEE, Jin Young Seoul, KR 165 1021
YEOM, Myeong Hoon Yongin, KR 17 98

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