Method for Measuring Recognition Warping about a Three-Dimensional Image

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United States of America Patent

SERIAL NO

14483342

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Abstract

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The invention relates to a method for measuring recognition warping with respect to a three-dimensional (3D) image. The method according to the invention comprises: (a) a step of selecting any one from a plurality of 3D parameters for a scale for recognizing a 3D image in a 3D manner; (b) a step of displaying a test stereoscopic image corresponding to the selected 3D parameter on a screen; (c) a step of displaying, on a screen, a plurality of sample images obtained by varying the value of the selected 3D parameter for the test stereoscopic image; (d) a step of selecting at least one of the plurality of sample images; and (e) a step of performing the steps (b) to (d) at least two times on different test stereoscopic images, and measuring a 3D recognition scale for the selected 3D parameter based on the sample image selected in the step (d). Therefore, it is possible to measure whether a viewer distortedly recognizes a 3D image or the degree to which a viewer recognizes the 3D image three-dimensionally in connection with the 3D parameter such as the size of the 3D image, the depth of the 3D image, etc. by means of the 3D recognition ability of each viewer.

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Patent Owner(s)

Patent OwnerAddress
CATHOLIC UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION505 BANPO-DONG SEOCHO-GU SEOUL 137-040

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kang, Hang-Bong Seoul, KR 8 37

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