TEST CONTROL DEVICE AND METHOD FOR TESTING SIGNAL INTEGRITIES OF ELECTRONIC PRODUCT
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United States of America Patent
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Issued Date -
Dec 25, 2014
app pub date -
Jun 25, 2014
filing date -
Jun 25, 2013
priority date (Note) -
Abandoned
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Abstract
A test control device and a method automatically test signal integrities of an electronic product. The test control device includes an oscilloscope and robot devices each holding a probe of the oscilloscope. The test control device sets test projects and locations of test points of each test project on the electronic product. The test control device selects a test project and selects probes for measuring electrical outputs at the test points of the selected test project, controls robot devices holding the selected probes to move tips of the selected probes to touch the test points, and controls the electronic product to activate the test points. The oscilloscope measures the electrical outputs at the test points through the selected probes. The test control device further obtains results of the measurements from the oscilloscope, analyzes and integrates all of the measurements, and generates a signal integrity report of the electronic product.
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