SUBSTRATE SUPPORT APPARATUS AND SUBSTRATE PROCESS APPARATUS HAVING THE SAME

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United States of America Patent

APP PUB NO 20140373782A1
SERIAL NO

14311207

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Abstract

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Provided is a substrate processing apparatus. The substrate processing apparatus includes a chamber in which a processing space is defined, a substrate support disposed in the chamber and supporting a substrate; and an upper electrode to which a radio frequency (RF) power is applied, the upper electrode facing the substrate support. The substrate support includes a plurality of ground electrodes spaced apart from each other and independently controlled so that plasma is uniformly generated to an edge area of the substrate support between the upper electrode and the substrate support. The substrate processing apparatus may uniformly control plasma distribution or density on a substrate and a periphery of the substrate and may uniformly control plasma distribution or density in the central area of the substrate and the edge area of the substrate.

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Patent Owner(s)

Patent OwnerAddress
WONIK IPS CO LTDSOUTH KOREA GYEONGGI DO PING ZE ZHENWEI ZHENWEI GROUP PRODUCED 75 ROAD SURFACE PYEONGTAEK GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
LEE, Nae Il Osan-Si, KR 1 46
PARK, Yong Gyun Anseong-Si, KR 2 53
SEO, Tae Wook Suwon-Si, KR 12 91

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