METHOD AND APPARATUS OF MEASURING OBJECTS USING SELECTIVE IMAGING
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United States of America Patent
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Issued Date -
Dec 18, 2014
app pub date -
May 29, 2014
filing date -
Jun 17, 2013
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Abstract
A method of measuring an object registers the object with a model of the object, and determines at least one feature of the object to scan. Next, the method controls an X-ray scanning device to scan less than the entirety of the object to produce visual data representing at least one scanned portion. The at least one scanned portion has the at least one feature, while the X-ray scanning device is controlled as a function of registering the object and model.
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