Method to enhance sensitivity to surface-normal optical functions of anisotropic films using attenuated total reflection
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United States of America Patent
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Issued Date -
Dec 4, 2014
app pub date -
May 22, 2014
filing date -
May 28, 2013
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Abandoned
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Abstract
Methodology for determining optical functions of thin films with enhanced sensitivity to “p” polarized electromagnetic radiation reflected from both interfaces of an absorbing film.
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