SYSTEM AND METHOD FOR DETECTING STRUCTURAL DEFECTS WITHIN A STENT
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United States of America Patent
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Issued Date -
Nov 20, 2014
app pub date -
Aug 14, 2012
filing date -
Aug 19, 2011
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Abandoned
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Abstract
The invention relates to a system (1) for detecting defects (12) within a structure of struts (2) forming a stent (3), the system comprising a power supply (8) for applying an electrical potential to a proximal end (9) and to a distal end (10) of said stent (3) in order to establish an electrical current flow between said proximal end (9) and said distal end (10), and a temperature sensor (7) such as a infrared camera, adjacent to said stent (3) for detecting a defect (12) within said structure of struts (2), said temperature sensor (7) being adapted to measure a temperature profile of said stent (3). Further, the invention relates to a respective method for detecting those defects (12).
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