SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
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United States of America Patent
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Issued Date -
Nov 20, 2014
app pub date -
Dec 13, 2012
filing date -
Dec 14, 2011
priority date (Note) -
Published
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Abstract
Disclosed are a semiconductor device and a method of fabricating the same. The method includes forming a first GaN layer, a sacrificial layer and a second GaN layer on a GaN substrate, wherein the sacrificial layer has a bandgap narrower than those of the GaN layers; forming a groove penetrating the second GaN layer and the sacrificial layer; growing GaN-based semiconductor layers on the second GaN layer to form a semiconductor stack; forming a support substrate on the semiconductor stack; and removing the GaN substrate from the semiconductor stack by etching the sacrificial layer. Accordingly, since the sacrificial layer is etched using the groove, the support substrate can be separated from the semiconductor stack without damaging the support substrate.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
SEOUL VIOSYS CO LTD | GYEONGGI DO SOUTH KOREA GYEONGGI-DO |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Cho, Dae Sung | Ansan-si, KR | 64 | 739 |
Lee, Chung Hoon | Ansan-si, KR | 264 | 3241 |
Nam, Ki Bum | Ansan-si, KR | 56 | 525 |
Seo, Won Cheol | Ansan-si, KR | 64 | 1524 |
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