Method for High-Resolution 3D Localization Microscopy
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United States of America Patent
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Issued Date -
Nov 20, 2014
app pub date -
May 13, 2014
filing date -
May 14, 2013
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Abstract
A method for high-resolution 3D localization microscopy, in which sample is used which has a boundary surface on the imaging side. The sample is illuminated with excitation light in order to excite fluorescence markers to emit light. The sample is imaged to a still image along an imaging direction, by means of imaging optics. The still image contains images of the fluorescing fluorescence markers. The imaging optics has a focal plane and an optical resolution. The excitation and imaging steps are repeated multiple times so that multiple still images are obtained. The excitation steps create images of at least a subset of the fluorescing fluorescence markers isolated in each of the still images. A location is determined in each of the still images and this location has a precision which is greater than the optical resolution. A high-resolution composite image is generated from the locations determined in this manner.
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