Controls of Ambient Environment During Wafer Drying Using Proximity Head

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United States of America Patent

SERIAL NO

14289624

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Abstract

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A method for processing a substrate is provided which includes generating a fluid meniscus to process the substrate and applying the fluid meniscus to a surface of the substrate. The method further includes reducing evaporation of fluids from a surface in the substrate processing environment.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATIONFREMONT CA 94538-6470

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
de, Larios John M Palo Alto, US 72 1005
Farber, Jeffrey Delmar, US 14 79
Korolik, Mikhail San Jose, US 88 4555
Ravkin, Mike Los Altos, US 63 1167

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