Test Apparatus and Method for Determining Long Term Reliability of an Implantable Device
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United States of America Patent
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Nov 6, 2014
app pub date -
May 5, 2014
filing date -
May 3, 2013
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Abstract
The present invention is a system and method for testing the long term reliability of an implantable device. The system provides a vessel containing temperature controlled buffered saline. A support structure suspends a test device in the vessel so it is submerged in the buffered saline and provides mechanical stress on the implantable devices. The test device is eclectically connected to a programmable signal generator and sensors to actively determine the integrity of the device during active testing.
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