MEASURING APPARATUS, MEASURING METHOD, AND MEASURING PROGRAM
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United States of America Patent
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Issued Date -
Oct 30, 2014
app pub date -
Apr 22, 2014
filing date -
Apr 26, 2013
priority date (Note) -
Abandoned
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Abstract
A measuring apparatus for measuring a characteristic of a crystal unit includes an input unit, a measuring unit, a storage unit, and a calibrating unit. The input unit is configured to input a measurement signal into the crystal unit. The measuring unit is configured to measure the characteristic of the crystal unit based on an output signal output from the crystal unit with respect to the measurement signal. The storage unit is configured to associate calibration data with a measuring condition to measure the characteristic of the crystal unit, and store the associated data. The calibration data is generated based on a measurement result measured by the measuring unit with connecting a short-circuit element instead of the crystal unit. The calibrating unit is configured to calibrate the characteristic of the crystal unit measured by the measuring unit based on the calibration data.
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