METHOD AND APPARATUS FOR DOCKING A TEST HEAD WITH A PERIPHERAL
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United States of America Patent
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Oct 23, 2014
app pub date -
Jul 11, 2012
filing date -
Jul 12, 2011
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Abstract
A method and apparatus for docking an electronic test head with a peripheral, which positions devices for testing. Exact-constraint alignment features, also sometimes known as kinematic features, are incorporated to provide repeatable positioning of the test head in three degrees of freedom with respect to the docking plane of the peripheral. A distinct alignment feature is used to provide planarity and to establish the required docked distance between the test head and the peripheral. The exact-constraint alignment features are mounted compliantly to enable them to position the test head in the plane while the test head is away from its final docked distance and to maintain that position as the test head is moved to its final docked position.
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