PROGRAMMER FOR CARDIAC IMPLANTABLE MEDICAL DEVICES, HAVING AN ACCELERATED TEST MODE OF THE PARAMETERS
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United States of America Patent
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app pub date -
Jun 30, 2014
filing date -
Apr 19, 2007
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Abandoned
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Abstract
A programmer for cardiac implantable medical devices, including an accelerated test mode of the operating parameters. The programmer includes a user interface that is used to define the tests to be performed on the implant and display the results thereof. These tests includes: ventricular and atrial sensing sensitivity, ventricular and atrial lead impedance, and ventricular and atrial capture threshold. Each test step involves (i) a predetermined setting of the operating mode, pacing rate and atrio-ventricular delay of the implantable device, (ii) collection of the operating data of the implantable device according to said predetermined settings, and (iii) processing and display of thus collected data. There further exists one test step of time compression along which at least some of the ventricular and atrial tests for a same parameter are executed simultaneously during a common step, preferably the tests of sensing sensitivity and lead impedance. The user interface allows for a preliminary selection of the tests to be performed, and the programmer is operated to execute these tests, linked in sequence, without any intervention by the user.
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