Inspection system for OLED display panels
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United States of America Patent
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Dec 15, 2020
Grant Date -
Oct 23, 2014
app pub date -
Apr 21, 2014
filing date -
Apr 22, 2013
priority date (Note) -
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status (Latency Note)
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Abstract
A system for inspecting at least a portion of a display panel having thin film transistors (TFTs) and light emitting devices (OLEDs), during or immediately following fabrication, so that adjustments can be made to the fabrication procedures to avoid defects and non-uniformities. The system provides bonding pads connected to signal lines on at least portions of the display panel, and probe pads along selected edges of the display panel. The probe pads are coupled to the bonding pads through a plurality of multiplexers so that the number of probe pads is smaller than the number of bonding pads.
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