PROBE HEIGHT FIXTURE PRODUCT PROFILE
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United States of America Patent
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Issued Date -
Oct 16, 2014
app pub date -
Apr 9, 2014
filing date -
Apr 12, 2013
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Abstract
Systems, methods, and apparatuses are provided for using a calibration fixture adapted for use with a measurement instrument having a sample probe needle. The calibration fixture can be used for calibrating a maximum depth the sample probe needle will travel to for optimal aspiration of samples within the wells of one or more of multiple different microplates. The calibration fixture can include multiple cavities to calibrate the sample probe needle height for each of multiple different microplates. Each cavity has a cavity height that corresponds with a known depth of the wells disposed within each different microplate.
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