DEVICE AND METHOD FOR COMBINING SAMPLES FROM AN INERTIAL MEASUREMENT SENSOR CLUSTER

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United States of America Patent

SERIAL NO

14311773

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Abstract

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Device and method for providing inertial indications with high accuracy using micro inertial sensors with inherent very small size and low accuracy. The device and method of the invention disclose use of the cluster of multiple micro inertial sensors to receive from the multiple sensors an equivalent single inertial indication with high accuracy based on the multiple independent indications and mathematical manipulations for averaging the plurality of single readings and for eliminating common deviations based, for example, on measurements of the deviation of the single readings.

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Patent Owner(s)

Patent OwnerAddress
ELBIT SYSTEMS LTDP O BOX 539 HAIFA 3100401

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Braginsky, Alex Rison Lezion, IL 3 8
Tzidon, Dekel Hod Hasharon, IL 36 404

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