SCANNING INSTRUMENT
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United States of America Patent
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Issued Date -
Oct 2, 2014
app pub date -
Mar 19, 2014
filing date -
Mar 29, 2013
priority date (Note) -
Abandoned
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Abstract
Provided is a scanning instrument that can obtain information about position and inclination of a central axis of an implant fixture used for an implant bridge with a high accuracy. A scanning instrument (10, 110) to be attached to an analog (20) that is embedded in a model, the scanning instrument comprising a main body (11, 111) having a cylindrical shape, a fixation member (12) to attach the main body to the analog, and a reference point (13) to obtain information about position and inclination of a central axis of the analog by using a pattern projection method.
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