SAMPLE ANALYSIS METHOD, SAMPLE ANALYSIS SYSTEM, AND RECOVERY METHOD
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Mar 27, 2014
filing date -
Mar 29, 2013
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
Disclosed is a sample analysis method using a sample measuring apparatus configured to operate under control of a first computer, the method comprising: making the sample measuring apparatus operate under control of a second computer instead of the first computer, the step including downloading, from an external server, a control program for executing a function of causing the sample measuring apparatus to start measurement of a sample, a function of receiving measurement data of the sample from the sample measuring apparatus, and a function of transmitting the received measurement data to the external server, and installing the control program in the second computer; causing the second computer to execute the installed control program to cause the sample measuring apparatus to perform measurement of a sample, and to transmit measurement data received from the sample measuring apparatus to the external server; and causing the external server to execute an analysis program for analyzing the measurement data received from the second computer, to analyze the measurement data and to generate an analysis result.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully