SUPPORT STRUCTURE AND HIGHLY ALIGNED MONOCHROMATING X-RAY OPTICS FOR X-RAY ANALYSIS ENGINES AND ANALYZERS
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United States of America Patent
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Issued Date -
Oct 2, 2014
app pub date -
Oct 25, 2012
filing date -
Oct 26, 2011
priority date (Note) -
Abandoned
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Abstract
A support structure having multiple highly aligned curved x-ray optics, the support structure having multiple internal partially or fully concentric surfaces upon which said optics are mounted, thereby aligning said optics along a central optical axis thereof and therefore to a source, sample, and/or detector in combination with which the support structure is useable. The surfaces may be nested around the central optical axis; and the support structure may divided longitudinally into sections around the central optical axis by walls. At least one of the x-ray optics comprises a curved diffracting optic, for receiving a diverging x-ray beam and focusing the beam to a focal area, in one embodiment a focusing monochromating optic. In an improved embodiment, an optic comprises a single layer, plastically deformed, LiF optic.
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