METHOD AND DEVICE FOR DETERMINING CHARACTERISTIC PROPERTIES OF A TRANSPARENT PARTICLE
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United States of America Patent
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N/A
Issued Date -
Sep 18, 2014
app pub date -
Aug 17, 2012
filing date -
Aug 17, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention relates to a method for determining the size d of a transparent particle, according to which method the particle is illuminated with light from a light source, a radiation detector measures a time-resolved intensity profile of light of the light source scattered by the particle, a reflection peak (10) and a refraction peak are determined in the intensity profile and the size d of the particle is determined based on a time difference between the reflection peak (10) and the refraction peak. The method according to the invention is characterized in that the time-resolved intensity profile is measured at a definable scattering angle θs, a first second-order refraction peak (11) and a second second-order refraction peak (12) having a mode different from that of the first refraction peak (11) being determined, a characteristic variable γ being determined as the ratio of a first time difference Δt01 between the reflection peak (10) and the first refraction peak (11) and of a second time difference Δt02 between the reflection peak (10) and the second refraction peak (11), and the size of only those particles being determined for which the characteristic variable γ corresponds to a definable value.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
TECHNISCHE UNIVERSITAET DARMSTADT | KAROLINEPLATZ 5 DARMSTADT D-64289 |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Schaefer, Walter | Aschaffenburg, DE | 6 | 8 |
Tropea, Cameron | Gross-Umstadt, DE | 4 | 7 |
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Mar 18, 2026 |
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