SYSTEM AND METHOD FOR DETECTING TARGET MATERIALS USING A VIS-NIR DETECTOR
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United States of America Patent
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Mar 17, 2014
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Nov 26, 2012
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Abstract
The present disclosure provides systems and methods for determining the presence of a target material in a sample. In general terms, the system and method disclosed herein provide collecting interacted photons from a sample having a target material. The interacted photons are passed through a tunable filter to a VIS-NIR detector where the VIS-NIR detector generates a VIS-NIR hyperspectral image representative of the filtered interacted photons. The hyperspectral image of the filtered interacted photons is analyzed by comparing the hyperspectral image of the filtered interacted phtons to known hyperspectral images to identify the presence of a target material in a sample. The systems and methods disclosed herein provide easy identification of the presence of a target material in a sample.
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