RESIST COMPOSITION, POLYMERIC COMPOUND, COMPOUND AND METHOD OF FORMING RESIST PATTERN

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United States of America Patent

APP PUB NO 20140220492A1
SERIAL NO

14171293

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Abstract

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A resist composition which generates acid upon exposure and exhibits changed solubility in a developing solution under action of acid, including a base component containing a polymeric compound having a structural unit derived from a compound represented by general formula (a0-1). R1 and R2 each independently represents a group represented by general formula (a0-2) or a functional group; V1 and V2 each represents a single bond or an alkylene group of C1 to C10 which may have a substituent; Y1 represents a single bond or a divalent linking group; Y2 represents a fluorinated alkylene group of C1 to C4 which may have a substituent; L1 represents O or a group represented by —NR′1—(R′1 represents H or an alkyl group of C1 to C5); Mm+ represents an organic cation having a valency of m; and m represents an integer of 1 or more.

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Patent Owner(s)

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TOKYO OHKA KOGYO CO LTD150 NAKAMARUKO NAKAHARA-KU KAWASAKI-SHI KANAGAWA 2110012 ?2110012

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  • 2014 Application Filing Year
  • G03F Class
  • 1816 Applications Filed
  • 1533 Patents Issued To-Date
  • 84.42 % Issued To-Date
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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaiho, Takaaki Kawasaki-shi, JP 15 84
Komuro, Yoshitaka Kawasaki-shi, JP 50 303

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges5953215649231386152801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0255075100125150175200225250275300325350375400425450475500525550575

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