Ga2O3 SEMICONDUCTOR ELEMENT

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United States of America Patent

APP PUB NO 20140217471A1
SERIAL NO

14343660

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Abstract

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Provided is a high-quality Ga2O3 semiconductor element. Provided is, as one embodiment of the present invention, a Ga2O3 MESFET (10), which includes: an n-type α-(AlxGa1-x)2O3 single crystal film (3), which is formed on an α-Al2O3 substrate (2) directly or with other layer therebetween, and is composed of an α-(AlxGa1-x)2O3 single crystal (0≦x≦1); a source electrode (12) and a drain electrode (13), which are formed on the n-type α-(AlxGa1-x)2O3 single crystal film (3); and a gate electrode (11), which is formed on a region between the source electrode (12) and the drain electrode (13) on the n-type α-(AlxGa1-x)2O3 single crystal film (3).

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Patent Owner(s)

Patent OwnerAddress
NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY4-2-1 NUKUI-KITAMACHI KOGANEI-SHI TOKYO 1848795 ?1848795
TAMURA CORPORATION1-19-43 HIGASHI-OIZUMI NERIMA-KU TOKYO 1788511 ?1788511
KYOTO UNIVERSITY36-1 YOSHIDA-HONMACHI SAKYO-KU KYOTO-SHI KYOTO 6068501 JAPAN

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Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20122013201420152016201720182019202020212022202320240255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujita, Shizuo Kyoto-shi, JP 26 180
Higashiwaki, Masataka Tokyo, JP 20 209
Sasaki, Kohei Tokyo, JP 52 293

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  • 7 Citation Count
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges7625916189582342423416712683684320001 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0500100015002000250030003500400045005000550060006500

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