METHOD OF CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT SUBJECTED TO IRRADIATION CONDITIONS
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United States of America Patent
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Issued Date -
Jul 24, 2014
app pub date -
Sep 5, 2012
filing date -
Sep 6, 2011
priority date (Note) -
Published
status (Latency Note)
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Abstract
A method of selecting a piece of electronic equipment subjected to irradiation conditions comprising at least one electronic component by characterizing a sensitivity parameter of the electronic component to the irradiation conditions listed in a predetermined specifications. The electronic component is irradiated with a source of ionizing radiation having the known irradiation characteristics and geometry. A set of operating values of the electronic component are measured during the irradiation of the electronic component. The sensitivity of the electronic component are measured for a number of irradiation conditions lower than all of the conditions listed in the specifications. The measured results are extrapolated to the other irradiation conditions of the specifications.
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