MATERIALS AND METHODS FOR HIGH-THROUGHPUT DETERMINATION OF GENOME-WIDE DNA METHYLATION PROFILE
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United States of America Patent
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Issued Date -
Jul 17, 2014
app pub date -
Jan 16, 2013
filing date -
Jan 16, 2013
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Abstract
The present invention provides materials and methods for rapid and sensitive determination of global methylation profile of genomic DNA. In one embodiment, the present invention provides the fluorescence polarization (FP) based measurement of DNA methylation (FPDM) assay, wherein the FPDM assay comprises restriction digestion of DNA molecules using a pair of methyl-sensitive and methyl-insensitive restriction endonuclease enzymes, polymerase chain extension of digested DNA molecules via the incorporation of fluorescently labeled dNTP(s), and analysis via fluorescence polarization techniques.
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