Method for Modifying Probe Tip
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United States of America Patent
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Issued Date -
Jul 10, 2014
app pub date -
Mar 13, 2013
filing date -
Jan 7, 2013
priority date (Note) -
Abandoned
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Abstract
A method for modifying the probe tip of a microscope, including the following steps of providing a substrate, providing a metal precursor solution with fluoride ion on the substrate, using the probe tip to dip into the metal precursor solution with fluoride ion on the substrate in order to form a nano-metal particle on the probe tip by the reduction reaction of at least one metal ion in the metal precursor solution. As the result, the probe tip having the nano-metal particle thereon can increase the spatial-resolution of the measuring performance of the field sensitive scanning probe microscope due to the great reduction of stray field effects.
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