Methods and Systems for Material Characterization
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United States of America Patent
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May 25, 2012
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May 27, 2011
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Abstract
A method for determining information regarding an object comprising particles includes obtaining a wave function representative of the object detected at a detection surface of a detection system for detecting the wave function, deriving at least two spatial frequencies of the detected wave function, and deriving for each of the at least two spatial frequencies at least a phase based on the obtained wave function. A functional relationship between the spatial frequency and the phase is analyzed for the spatial frequencies. At least one parameter indicative of a property of the object is derived therefrom. A corresponding system involves the method as well as corresponding computer-related products.
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