EVALUATING METHOD FOR PATTERN, EVALUATING METHOD, EVALUATING PROGRAM AND EVALUATING APPARATUS FOR MULTICOMPONENT MATERIAL
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United States of America Patent
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Issued Date -
May 29, 2014
app pub date -
May 31, 2012
filing date -
Jun 1, 2011
priority date (Note) -
Abandoned
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Abstract
An evaluating apparatus for a pattern includes a FP preparing part preparing a target FP at a specific detection wavelength from a 3D chromatogram of a multicomponent material being an evaluation target, a peak pattern preparing part preparing a peak pattern for each peak of the target reference FPs that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, a peak assigning part specifying the corresponding peaks by comparison of the peak patterns and UV spectra of the peaks, and an evaluating part evaluating the assigned peaks by comparison with peaks of a plurality of reference FPs.
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