RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN

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United States of America Patent

APP PUB NO 20140147787A1
SERIAL NO

14084025

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Abstract

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A resist composition which generates an acid upon exposure and exhibits changed solubility in a developing solution by the action of an acid, the resist composition containing a base material component which exhibits changed solubility in a developing solution by the action of an acid, the base material component containing a high-molecular weight compound having a constituent unit derived from a compound represented by the following formula (a0-1), a constituent unit containing a lactone-containing, a SO2—-containing or a carbonate-containing cyclic group, and a constituent unit containing an acid decomposable group whose polarity increases by the action of an acid, and the high-molecular weight compound having a weight average molecular weight of not more than 6,000, and a method for forming a resist pattern using the same.

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Patent Owner(s)

Patent OwnerAddress
TOKYO OHKA KOGYO CO LTD150 NAKAMARUKO NAKAHARA-KU KANAGAWA KAWASAKI-SHI 211-0012

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Arai, Masatoshi Kawasaki-shi, JP 248 2096
Dazai, Takahiro Kawasaki-shi, JP 73 876
Utsumi, Yoshiyuki Kawasaki-shi, JP 88 732

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