EVALUATING METHOD FOR PATTERN, EVALUATING METHOD FOR MULTICOMPONENT MATERIAL, EVALUATING PROGRAM, AND EVALUATING APPARATUS
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United States of America Patent
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Issued Date -
May 22, 2014
app pub date -
May 31, 2012
filing date -
Jun 1, 2011
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Provided are a target FP preparing step, a target FP peak assigning step 149, a target FP peak feature value preparing step, a target FP type-2 preparing step, a target FP area segmentation feature value preparing step, a target FP feature value integrating step, and an evaluating step, to prepare target FP integrated feature values by integrating target FP peak feature values and target FP area segmentation feature values, and to compare and evaluate the target FP integrated feature values and reference FP integrated feature values that correspond to the target FP integrated feature values and are based on a plurality of reference FPs of multicomponent materials as evaluation criteria.
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