MATERIAL SAMPLING DEVICE WITH INTEGRATED MATERIAL ANALYZER ASSEMBLY
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United States of America Patent
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Issued Date -
May 15, 2014
app pub date -
Nov 12, 2013
filing date -
Nov 14, 2012
priority date (Note) -
Abandoned
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Abstract
A material sampling and analyzing assembly comprises a material sampling device and a material analyzer assembly. The material sampling device is configured to extract a core sample of material from a supply of material. The material analyzer assembly is attached to a portion of the material sampling device. The material analyzer assembly comprises a first material analyzer configured to analyze a first testing sample, which comprises a first portion of the core sample. An alternate material sampling an analyzing assembly comprises a material sampling device comprising a discharge chute and a material analyzer assembly comprising a sample container and a material analyzer. The sample container is attached to the discharge chute. The sample container is configured to receive and temporarily retain a testing sample that is discharged from the discharge chute. The material analyzer is configured to analyze the testing sample while it is retained by the sample container.
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