Indented Mold Structures For Diamond Deposited Probes
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United States of America Patent
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Issued Date -
May 8, 2014
app pub date -
Nov 7, 2012
filing date -
Nov 7, 2012
priority date (Note) -
Abandoned
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Abstract
The present invention discloses a method of fabricating a scanning probe microscopy probe including positioning a pattern probe over a mold substrate; indenting the pattern probe into the mold substrate material to form a mold pit; depositing a film onto the mold substrate including the mold pit; removing a portion of the deposited film to form a probe, and releasing the probe from the mold substrate material.
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