Random Doping Fluctuation Resistant FinFET

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United States of America Patent

APP PUB NO 20140103437A1
SERIAL NO

14051163

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Abstract

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An improved fin field-effect transistor (FinFET) is built on a compound fin, which has a doped core and lightly doped epitaxial channel region between that core and the gate dielectric. The improved structure reduces FinFET random doping fluctuations when doping is used to control threshold voltage. Further, the transistor design affords better source and drain conductance when compared to prior art FinFETs. Three representative embodiments of the key structure are described in detail.

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SEMIWISE LIMITEDGLASGOW G12 8LT

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Inventor Name Address # of filed Patents Total Citations
Kapoor, Ashok K Palo Alto, US 101 3596
Strain, Robert J San Jose, US 22 444

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  • 9 Citation Count
  • H01L Class
  • 7.09 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges7625916189582342423416712683684320001 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0500100015002000250030003500400045005000550060006500

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