Time Domain Reflectometry Step to S-Parameter Conversion

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United States of America Patent

SERIAL NO

14107474

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Abstract

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A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.

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Patent Owner(s)

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LECROY CORPORATION700 CHESTNUT RIDGE ROAD CHESTNUT RIDGE NY 10977

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Doshi, Kaviyesh Emerson, US 8 417
Pupalaikis, Peter Ramsey, US 4 14
Sureka, Anirudh Mamaroneck, US 7 156

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