TESTING AND MEASURING DEVICES, SYSTEMS, COMPONENTS AND METHODS
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Oct 20, 2011
filing date -
Oct 22, 2010
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
The embodiments are directed to high precision Micro-Penetration Strength Testers, high pressure Micro-Compression Testers, and/or the like adapted for testing non-conductive thin films or membranes and coated films or coated membranes. At least certain embodiments are directed to Z-direction mechanical and/or insulation strength test methods, devices, instruments, equipment, apparatus, and/or systems, Micro-Penetration Strength Testers adapted for testing thin films, Micro-Compression Testers adapted for testing thin films, high precision Nano Testers for testing non-conductive or semi-conductive materials, films, coatings, coated films, and/or the like, Nano-Penetration Strength Testers, Nano-Compression Testers, Z-Direction Strength Testers, improved indenter tips, micro indenter tips, nano indenter tips, indenter tips for converting a Micro- or Nano-Penetration Strength Tester into a Micro- or Nano-Compression Tester, and/or the methods of converting Micro-Penetration Strength Testers into Micro-Compression Testers.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully