METHOD AND SYSTEM FOR TESTING MATRICES AND METHOD FOR CONTROLLING VOLTAGE CLOCKS

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United States of America Patent

APP PUB NO 20140077814A1
SERIAL NO

13747296

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Abstract

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The present invention discloses method and system for testing matrices and method for controlling voltage clocks, comprising the steps of: providing a matrix circuit comprising a plurality of first end points and a plurality of second end points, wherein there is a path having a switch thereon between each of the first end points and a corresponding one of the second end points; supplying pulse voltages to the first end points or the second end points in accordance with a time sequence, wherein each of the pulse voltages has a given time width and there is no temporal overlap between the pulse voltages; and determining whether or not each of the switches functions properly through simultaneous depressing of more than one of the switches and on the basis of the amounts of time for which respective pulse voltages function at the first end points or the second end points.

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Patent Owner(s)

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CHICONY ELECTRONICS CO LTDNO 69 SEC 2 GUANGFU RD SANCHONG DIST NEW TAIPEI CITY 241

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  • 2013 Application Filing Year
  • G01R Class
  • 4386 Applications Filed
  • 3938 Patents Issued To-Date
  • 89.79 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances2013201420152016201720182019202020212022202320240255075100

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Inventor Name Address # of filed Patents Total Citations
Tseng, Chin-Cheng New Taipei, TW 1 1

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  • 1 Citation Count
  • G01R Class
  • 7.29 % this patent is cited more than
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1229483191025329202418992101 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0501001502002503003504004505005506006507007508008509009501000

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