MULTIPLE PATHS MEASURING AND IMAGING APPARATUS AND METHOD
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United States of America Patent
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Issued Date -
Mar 13, 2014
app pub date -
Sep 13, 2013
filing date -
Sep 13, 2012
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Abandoned
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Abstract
The invention discloses an optical interferometer which can be used to provide simultaneous measurements over multiple path lengths and methods to employ such an interferometer as to achieve a variety of functions covering simultaneous measurements at different depths separated by an increment of a multiple differential delay in the interferometer as well as simultaneous polarization measurements from a given depth and imaging. Configurations and methods are presented to encode the axial length in an object under investigation using frequency shifting as well as chirping the frequency of signals determining the frequency shifting. Methods are disclosed on the combination of multiple path configurations as to achieve versatile functionality in measurements, by using either broadband excitation or swept source excitation, combined with either discreet frequency shifting or chirped frequency shifting. Under swept source excitation, the invention discloses a long axial range apparatus, with constant sensitivity.
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