SYSTEM FOR MEASURING MATERIAL LEVELS USING CAPACITANCE AND TIME DOMAIN REFLECTOMETRY SENSORS

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United States of America Patent

APP PUB NO 20140049274A1
SERIAL NO

14113866

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus and system for measuring levels of two or more materials maintained within a storage tank using a combination of both a capacitance sensor and a time domain reflectometry (“TDR”) waveguide sensor is disclosed. The apparatus includes a combined circuit for the capacitance sensor and TDR sensor that creates a separation between the return signal from the capacitance sensor and the TDR sensor. The need for the return signal separation is due to the generation of false reflection signals from the capacitance circuitry. In a preferred embodiment, the separation in time is created by moving the capacitance false reflections further in time than the true signal returns. An alternative preferred embodiment would delay the true TDR signals passed the capacitance false reflections. Another alternative preferred embodiment would provide a substantially matched impedance of the capacitance circuit to the TDR circuit, to substantially eliminate the false reflections.

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Patent Owner(s)

Patent OwnerAddress
AMETEK INCSTATION SQUARE PAOLI PA 19301

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hafer, Kevin G Douglassville, US 8 49

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