Handheld Devices, Systems, and Methods for Measuring Parameters
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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N/A
Issued Date -
N/A
app pub date -
Mar 14, 2013
filing date -
Aug 3, 2012
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
Embodiments of the present disclosure are generally directed to handheld systems, individual components, and methods of using such systems and components for measuring parameters, such as electrical, mechanical, and physical measurement parameters. In one embodiment of the present disclosure, a host handheld device generally includes a measuring system for measuring a first parameter, wherein the first parameter is an electrical parameter, and a receiving system for receiving at least a second parameter from a separate module device.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
FLUKE CORPORATION | 6920 SEAWAY BOULEVARD EVERETT WA 98203 |
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Epperson, David Lawrence | Everett, US | 10 | 144 |
# of filed Patents : 10 Total Citations : 144 | |||
Heydron, Paul Herman | Everett, US | 4 | 90 |
# of filed Patents : 4 Total Citations : 90 | |||
Hudson, Jeffrey Charles | Snohomish, US | 1 | 27 |
# of filed Patents : 1 Total Citations : 27 | |||
Katz, Luis Alberto | Everett, US | 2 | 44 |
# of filed Patents : 2 Total Citations : 44 | |||
Koppelmans, Henricus | Uden, NL | 2 | 44 |
# of filed Patents : 2 Total Citations : 44 | |||
Vetter, Glen Howard | Stanwood, US | 7 | 91 |
# of filed Patents : 7 Total Citations : 91 |
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Patent Citation Ranking
- 27 Citation Count
- G01R Class
- 82.97 % this patent is cited more than
- 11 Age
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11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Aug 6, 2025 |
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