INSPECTION DEVICE

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United States of America Patent

APP PUB NO 20140028833A1
SERIAL NO

14002084

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An inspection device, suitable for use when inspecting a component for defects, including a cluster of lights which are arranged into two or more groups of lights, wherein the cluster of lights is configured such that each group of lights can be operated asynchronously to the other group(s) of lights so that light can be directed asynchronously at a component, from different directions; an image capturing means which is configured to capture an image of a component when each of the groups of lights are lit, to provide a plurality of images, each image showing the component lit from a different direction; a processing means configured to perform arithmetic computation using the images, so as to provide a single image in which defects in the component can be more easily identified. Also, a corresponding method of inspecting a component and a lighting arrangement with a dome and a diffuser.

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Patent Owner(s)

Patent OwnerAddress
ISMECA SEMICONDUCTOR HOLDING SA2300 LA CHAUX-DE-FONDS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Abrial, Pierrick Neuchatel, CH 4 3
Craveiro, Franco Hauterive, CH 2 5
Sia, Yaw Yoong Kajang, MY 1 0

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges48619794982251215936212221143901 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0100200300400500600700800900100011001200130014001500160017001800190020002100

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