Method of Determining a Focal Point or Beam Profile of a Laser Beam in a Working Field

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United States of America Patent

SERIAL NO

14040896

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Abstract

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In a method for determining the focal point or the beam profile of a laser beam, which can be deflected in the x and y directions by a scanner optic or an x-y-movement unit and can be displaced in the z direction by a focusing optic or a z-movement unit, at a plurality of measurement points in the two-dimensional working field or three-dimensional working space of the laser beam. An aperture diaphragm, followed by a detector, is arranged at each measurement point. At each measurement point, for x-y-focal point or beam profile measurements, the laser beam is moved by the scanner optic or the x-y-movement unit in an x-y-grid over the measurement aperture in the aperture diaphragm, and, at each grid point, the laser power is measured by the detector, the scanner axis of the scanner optic or the x-y-movement unit being stationary. For z-focal point measurements, the laser beam is displaced by the focusing optic or the z-movement unit in the z direction within the measurement aperture in the aperture diaphragm. The laser power is measured by the detector at each grid point. The focal point and/or the beam profile of the laser beam is then determined at each measurement point from the measurement values.

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Patent Owner(s)

Patent OwnerAddress
TRUMPF LASER GMBHGERMANY SHI BERG SCHRAMBERG BADEN-WURTTEMBERG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Notheis, Thomas Schramberg, DE 11 17

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