DYNAMIC TEMPERATURE CALIBRATION
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United States of America Patent
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Jan 23, 2014
app pub date -
Jul 11, 2013
filing date -
Jul 11, 2012
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Abstract
A hand-held processor system for processing data from an integrated MEMS (Micro-Electro-Mechanical-Systems) device disposed within a hand-held computer system and methods therefor. The Dynamic Temperature Correction (DTC) process computes offset values to calibrate MEMS sensors using a single set of data measurements at an orientation without dynamic perturbation and one or more temperature data measurements, and without requiring advance knowledge of orientation of the device. Arbitrary output biases, which are known to be dominant on a single axis, can be corrected to ensure consistent performance. The DTC process provides a simple method to effectively calibrate a MEMS sensor without requiring extensive system resources. This process can be enhanced by additional estimations of sensor offsets using the set of data measurements or by use of rule-based empirical gain factors.
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