THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD
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United States of America Patent
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app pub date -
Sep 9, 2013
filing date -
May 27, 2009
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Abstract
A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.
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