Super-Long Semiconductor Nano-Wire Structure and Method of Making

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United States of America Patent

APP PUB NO 20140008604A1
SERIAL NO

13502110

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Abstract

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The present invention disclosure provides a super-long semiconductor nanowire structure. The super-long semiconductor nanowire structure is intermittently widened to prevent fractures in the super-long semiconductor nanowire structure. At the same time, the present invention further provides a method of making a super-long semiconductor nanowire structure. The method forms an intermittently widened super-long semiconductor nanowire structure using photolithography and etching. Because the super-long semiconductor nanowire structure is intermittently widened, fracturing of the super-long semiconductor nanowire structure during etching can be avoided, making it easier to form a super-long and ultra-thin semiconductor nanowire structure.

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Patent OwnerAddress
FUDAN UNIVERSITYSHANGHAI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wu, Dongping Shanghai, CN 33 312
Zhang, Shi-Li Stockholm, SE 16 34
Zhang, Wei Shanghai, CN 2625 19909
Zhu, Zhiwei Shanghai, CN 40 1798

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