Method Of Deadtime Correction in Mass Spectrometry
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United States of America Patent
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Jan 2, 2014
app pub date -
Jan 9, 2012
filing date -
Jan 10, 2011
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Abstract
A method of improving the fidelity of m/z dependent and/or intensity measurements for a species of interest in an analyte to correct for hardware limitations within a mass spectrometer, which method comprises the steps of acquiring raw data produced by a mass spectrometer, identifying a region within the raw data that relates to the species of interest, forming a mathematical model to calculate the joint probability distribution of the parameters effecting the m/z dependent and/or intensity measurements, analytically obtaining samples from the joint probability distribution to produce corrected or refined m/z dependent and/or intensity measurements with associated uncertainties.
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